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Contact Mode AFM encompasses a variety of techniques wherein the tip is in continuous physical contact with the sample surface. Usually the deflection of the cantilever is used as the primary feedback mechanism.
The Dimension Icon system is comprised of the piezo scanner, optics, the AFM detection system, and the NanoScope V controller. The system interacts with the sample via a tip attached to the end of a small cantilever. During imaging, a laser beam is reflected off of the back of the cantilever and the piezo element in the scanner physically moves the probe in the X, Y and Z directions. As the tip scans across the surface, changes in topography of the sample cause changes in the deflection of the cantilever. These changes in the cantilever's deflection are detected by sensing movement of the laser beam on a photodetector. The resulting voltage output ranges from +10 V to –10 V, depending upon the position of the laser spot on the photodiodes. This position change is read by the feedback loop, which moves the sample in Z to restore the spot to its original position.
The Ramp Mode allows you to check the interaction between the cantilever and the sample surface. For detailed information regarding force ramps, see Contact Mode Force Calibration.
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